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Difference between revisions of "X-Ray Fluorescence Spectrometers"
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X-Ray Fluorescence Spectrometers (view source)
Revision as of 05:31, 25 December 2012
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X-Ray Fluorescence Spectrometer is a non-destructive analytical technique used to identify and determine the concentrations of elements present in solid, powdered and liquid samples. | |||
X-ray fluorescence spectrometer is capable of measuring elements from beryllium (Be) to uranium (U) and beyond at trace levels often below one part per million and up to 100%. | |||
The X-ray fluorescence spectrometer measures the individual component wavelengths of the fluorescent emission produced by a sample when irradiated with X-rays.X-ray fluorescence is the emission of characteristic secondary X-rays from a material that has been excited by bombarding with high-energy X-rays or gamma rays. The phenomenon is widely used for element analysis | |||
and chemical analysis, particularly in the investigation of metals, glass, | |||
ceramics and building materials, and for research ingeochemistry, forensic science and archaeology. | |||